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Optical Reference Systems wins record orders for in-situ monitors
Equipment orders at UK firm double following last year’s funding round
ORS (Optical Reference Systems) is pleased to announce record orders for its range of real time in-situ monitoring solutions, used in the production of compound semiconductor wafers.
ORS systems are used to monitor, record, and analyze various parameters such as growth rate, uniformity, and thickness during the deposition process, for such products as LEDs, Lasers, RF equipments, etc.
Real-time monitoring of each layer as it is deposited is important, if not essential, to maximize wafer yield, minimize scrap, maximize production equipment (reactor) up time, repeatability, and enhanced quality, all of which contribute to bottom line profitability and customer satisfaction. For certain materials for example gallium nitride, in-situ monitoring is essential.
The order book for the first half of the year is considerably more than that for the whole of last year and includes orders from North America, Asia, and Europe. The accelerated growth follows a round of funding that completed December last year.
For further details please contact:
Mark Musgrave or Jenny Miller,
ORS Limited,
OpTIC Technium,
St Asaph Business Park,
St Asaph, LL17 0JD,
United Kingdom
T: +44 (0)1745 535188
F: +44 (0)1745 535186
e-mail: mark@ors-ltd.com or jenny@ors-ltd.com
Visit: http://www.ors-ltd.com
Source: ORS (Optical Reference Systems)
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