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Accel-RF Announces New High Voltage Switching Test System

Addresses need for reliability and burn-in testing of GaN and SiC devices

Accel-RF Instruments announced the release of its new High Voltage Switching Test System at the CS International show in Brussels, Belgium earlier this month. The world's first fully integrated power-switching system addresses an industry wide critical need for reliability and burn-in testing of increasingly popular GaN and SiC devices.

Accel-RF's High Voltage Switching Test System is capable of measuring performance degradation at base-plate temperatures up to 200degC under a variety of conditions including switching-power applications up to 1kV (off) and 25A (on) for up to 1-MHz switching frequencies.

The hardware and software supports both soft- and hard-switching applications. The Accel-RF test platform leverages the integration of its high temperature operating life (HTOL) burn-in platform with new fast-switching measurement techniques. This capability builds on the industry-leading AARTS test platform and solidifies Accel-RF's product offering as the most comprehensive HTOL test platform in the marketplace.

 "With the emergence of compound semiconductors, such as GaN and SiC, for use in power-switching systems, establishing reliability performance metrics to use-applications is critical to the time-to-market phase of the technology,"explained David Sanderlin, CTO and executive VP of Accel-RF.

"Our platform affords characterisation not only in basic reliability statistics in a controlled "soft-switch" setting, but also supports the requirement to induce the higher-stress "hard-switch" environment of a real application. Moreover, we achieve this capability without requiring huge external load resistors and associated heat dissipation and physical size", he added.

The High Voltage Switching Test System is available in 2 - 24 channel configurations, and can be customised to support multiple device package types including TO-220, TO-247, and SMD.



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