Technical Insight
Keithley puts laser diodes to the test (Product Showcase)
Keithley Instruments model 2520 pulsed laser diode test system is designed for electrical characterization of laser diodes used as sources in optical networks, in optical read/write heads in data storage and materials processing and medical applications. Able to handle either chip/bars or modules, the 2520 tests in pulse mode up to 5 A peaks and pulse widths as short as 500 ns with rise and fall times less than 60 ns. In addition, three measurement channels are available with a remote digitizing head. One channel measures voltage across the laser diode. Two voltage-biased current measurement channels are used for simultaneous measurement of the front and back photodiode detector outputs needed to characterize edge-emitting lasers. The 2520 determines threshold current, light-intensity (L-I) efficiency, and current-voltage (I-V) linearity (see ). Contact Ellen Modock, Keithley Instruments, 28775 Aurora Road, Cleveland, OH 44139-1891, USA
Tel. +1 440 498 2746
Fax +1 440 248 6168
E-mail modock_ellen@keithley.com
Tel. +1 440 498 2746
Fax +1 440 248 6168
E-mail modock_ellen@keithley.com
