+44 (0)24 7671 8970
More publications     •     Advertise with us     •     Contact us
 
Technical Insight

Prober eyes challenging circuits (Product Showcase)

Cascade Microtech has unveiled a probe designed to provide a number of simultaneous connections to a wafer. The Eye-Pass system also employs power bypassing to provide low-impedance and resonance-free power connections over a wide frequency range. Among the other benefits are on-wafer evaluation of digital circuits, oscillation-free testing of wide-bandwidth analog circuits and compatibility with the company s Air Coplanar probes, which allows functional testing at speed for known-good-die. Flexibility is also built-in with up to 12 contacts per probe head. Available contact types include ground, logic, standard and Eye-Pass power supply, power supply sense and AC signal (see ). Contact Ellen Payne, Cascade Microtech, 2430 NW 206th Avenue, Beaverton, OR 97006, USA Tel. +1 503 601 1181 Fax +1 503 601 1002 E-mail ellen_payne@cmicro.com
×
Search the news archive

To close this popup you can press escape or click the close icon.
×
Logo
×
Register - Step 1

You may choose to subscribe to the Compound Semiconductor Magazine, the Compound Semiconductor Newsletter, or both. You may also request additional information if required, before submitting your application.


Please subscribe me to:

 

You chose the industry type of "Other"

Please enter the industry that you work in:
Please enter the industry that you work in: