Technical Insight
VCSEL burn-in and test contract for Aehr (Materials and Equipment)
Aehr Test Systems, a company that supplies burn-in and parallel test systems based in Fremont, CA, has received its first wafer-level burn-in system order from a VCSEL manufacturer. The order marks the first phase of a development partnership, and the system is scheduled for delivery in the first half of 2002. The silicon industry employs wafer-level burn-in and test to reduce costs by identifying known-good die for use in multi-chip modules and systems-in-a-package. Aehr s FOX contact system is typically used to test all pads on a wafer simultaneously, providing cost-effective burn-in and testing of DRAM chips. "This is an opportunity for Aehr Test to penetrate the emerging market for test equipment for optical communications devices," said president and COO, Carl Meurell. "Contacting thousands of laser diodes simultaneously on a GaAs wafer will be a challenge, but we believe that burn-in at the wafer level can offer manufacturers a big cost-saving advantage. "We anticipate that the success of the first phase of this partnership will lead to follow-on orders for wafer-level systems and contact systems for VCSEL wafer burn-in," added Meurell.
