Supplier of non contact resistance measurement and resistivity measurements systems to measure wafers, EPI, Implant, Metal with mapping or inline.
KITEC microelectronic technologie was founded 1987 and is specialized in non contact resistance measurement technology and non contact wafer thickness measurements for wafer substrates as well as for processed wafers after EPI, Implant, Metalization or other coating processes caoting conductive layers. With many years of experience we provide precision measurement systems with automatic corrections to match with other measurement methods and with outperforming tool to tool match as well as long term stability with no need of calibration adjustments over months and and even years.
