Contact:
Carrie Andre
Website:
https://www.k-space.com/
Phone:
(734) 426-7977
Email:
candre@k-space.com
Carrie Andre
Website:
https://www.k-space.com/
Phone:
(734) 426-7977
Email:
candre@k-space.com
|
K-Space Associates |
| Leaders in Advanced Thin-Film Metrology Solutions for Research Development and Production, k-Space Associates, Inc. is a leading manufacturer of in situ, in-line, and ex situ metrology tools for the semiconductor, thin-film, and photovoltaic (PV) industries. Our tools are used for monitoring nearly all thin-film deposition processes, including MBE, MOCVD, PLD, PVD, ALD, sputtering, and evaporation. Measure carrier emissivity/life, wafer and film temperature, thin-film stress and strain, wafer curvature, wafer bow, wafer tilt, surface roughness and quality, film thickness and deposition rate, optical band gap, and atomic spacing with k-Space Associates metrology tools. k-Space is driven to supply the best technical support in the industry with tools that are used worldwide in both research and full production environments. | |
