K-Space AssociatesLeaders in Advanced Thin-Film Metrology Solutions for Research Development and Production, k-Space Associates, Inc. is a leading manufacturer of in situ, in-line, and ex situ metrology tools for the semiconductor, thin-film, and photovoltaic (PV) industries. Our tools are used for monitoring nearly all thin-film deposition processes, including MBE, MOCVD, PLD, PVD, ALD, sputtering, and evaporation.
Measure carrier emissivity/life, wafer and film temperature, thin-film stress and strain, wafer curvature, wafer bow, wafer tilt, surface roughness and quality, film thickness and deposition rate, optical band gap, and atomic spacing with k-Space Associates metrology tools.
k-Space is driven to supply the best technical support in the industry with tools that are used worldwide in both research and full production environments.
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