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K-Space Celebrates 30-Year Anniversary


Thin-film metrology company started as university spinoff now has thousands of customers worldwide

K-Space Associates is celebrating 30 years of helping the world’s leading technology makers develop, monitor, control, and manufacture their products in the thin-film, semiconductor, solar and glass markets, to name a few.

Darryl Barlett, CEO of K-Space Associates said:, “After 30 years it’s still so satisfying to walk into a laboratory or a manufacturing facility and see our metrology tools being used in real-time for process monitoring and control.”

K-Space’s thin-film metrology applications employ patented methods to accurately measure and monitor wafer temperature, stress, curvature, bow, deposition rate, reflectivity, spectral reflectance and transmission, and reflection high-energy electron diffraction (RHEED).

On the industrial metrology side, K-Space’s tools are used in production facilities worldwide to measure precise part features, surface defects, and more to ensure high yield and quality compliance.

K-Space has distributors in Europe, India, China, Japan, Korea, and throughout the world. K-Space continues to develop new solutions that help its customers fulfill even their most complex metrology needs. “You can never stop innovating!” remarked Barlett.

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