K-Space Celebrates 30-Year Anniversary
Thin-film metrology company started as university spinoff now has thousands of customers worldwide
K-Space Associates is celebrating 30 years of helping the world’s leading technology makers develop, monitor, control, and manufacture their products in the thin-film, semiconductor, solar and glass markets, to name a few.
Darryl Barlett, CEO of K-Space Associates said:, “After 30 years it’s still so satisfying to walk into a laboratory or a manufacturing facility and see our metrology tools being used in real-time for process monitoring and control.”
K-Space’s thin-film metrology applications employ patented methods to accurately measure and monitor wafer temperature, stress, curvature, bow, deposition rate, reflectivity, spectral reflectance and transmission, and reflection high-energy electron diffraction (RHEED).
On the industrial metrology side, K-Space’s tools are used in production facilities worldwide to measure precise part features, surface defects, and more to ensure high yield and quality compliance.
K-Space has distributors in Europe, India, China, Japan, Korea, and throughout the world. K-Space continues to develop new solutions that help its customers fulfill even their most complex metrology needs. “You can never stop innovating!” remarked Barlett.
The leading global compound semiconductor conference and exhibition will once again bring together key players from across the value chain for two-days of strategic technical sessions, dynamic talks and unrivalled networking opportunities.
Join us face-to-face on 18-19 April 2023
- View the agenda.
- 3 for the price of 1. Register your place and gain complementary access to TWO FURTHER industry leading conferences: PIC International and Power Electronics International.
- Email info@csinternational.net or call +44 (0)24 7671 8970 for more details.
