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Interview

Power GaN: The 300 mm milestone

News

Migrating the manufacture of GaN power devices to 300 mm lines will boost yield, improve metrology and trim costs.

BY RICHARD STEVENSON, EDITOR, CS MAGAZINE

A common metric for measuring performance of any device is the bang per buck.

When it comes to GaN, there are many ways to measure that ‘bang’. They include the on-resistance, the breakdown voltage, and the mobility of the two-dimensional electron gas.

But what about the ‘buck’? That’s a little harder to fathom, as chipmakers rarely reveal their yield, or the cost of producing their devices. But there are occasions when they will champion their efforts to trim their manufacturing costs, such as a move to larger wafers.

Claiming significant success on this front is the well-known European producer of power electronics, Infineon. It grabbed the headlines this autumn, when announcing the fabrication of the first GaN power devices on 300 mm wafers.

With manufacturers of GaN-on-silicon HEMTs currently carrying out production on substrates with a diameter of 200 mm, and sometimes less than that, Infineon’s milestone is more than doubling the number of devices produced per wafer.

Note, though, that this gain is not the only one that will help to trim the cost of production. According to Johannes Schoiswohl, Infineon’s Business Line Head for GaN, migration to larger wafers also leads to improvements to the manufacturing process, such as a higher yield and access to superior metrology. Engineers at Infineon enjoyed these when progressing from 150 mm to 200 mm wafers, and they are seeing them again in the move to the 300 mm platform.

“We can get really great results – better than expected – because the 300-millimetre tools, from a performance perspective, from a monitoring perspective and a process control perspective, are better than the 8-inch tools,” remarks Schoiswohl.

Due to these benefits, Infineon took just 18 months to develop its 300 mm process, building on its 200 mm GaN-on-silicon technology.