Eumetrys to distribute YPI–Clear Scanner
At the CS ManTech show in New Orleans (19th - 22nd May 2025), Eumetrys, a French integrator of metrology and inspection equipment, is announcing the global exclusive distribution of the YPI -Clear Scanner manufactured by Japanese company YGK.
This laser scanning particle inspection tool for un-patterned compound semiconductor substrates is said to enhance the quality control of semiconductors by inspecting the surface of various opaque and transparent wafers, including SiC, GaN, InP, sapphire, GaAs, silicon, and glass.
The tool is compatible with transparent, semi-transparent, and opaque wafers ranging from two to 12 inches, including thin and bowed wafers. It detects particles, haze, scratches, and area defects with high precision.
Other benefits, according to Eumetrys, are that the tool is built with standard components, ensuring low total cost of ownership and reliable long-term operation; and has been engineered for high throughput and maximum uptime.
“We are proud to add this competitively priced scanner to our current product range of turnkey solutions for semiconductor fabs,” said Yannick Bedin, CEO of Eumetrys. “Wafer default inspection is a crucial step in the manufacturing process to ensure utmost quality and yield. With this reliable and fully customisable scanner developed specifically for the compound semiconductor market, chip makers can quickly respond to the stringent quality standards dictated by increasingly complex manufacturing processes.”
