JEDEC releases new SiC guidelines
JEDEC Solid State Technology Association has announced the publication of two new documents to support the growing adoption of SiC power semiconductors.
JEP203: Guideline for Short Circuit Evaluation in Power Conversion Transistors, provides guidance for evaluating short-circuit capability of power MOSFETs, helping engineers improve protection design, testing consistency, and system robustness in applications such as EVs, industrial drives, and energy infrastructure.
JEP204: Catalog of Stress Procedures for SiC Devices for Power Electronic Conversion, is a comprehensive reference covering reliability, environmental, and ruggedness stress procedures for SiC power devices. The publication gives qualification engineers and device manufacturers a common framework for evaluating long-term reliability and performance, helping accelerate industry alignment and increase confidence in next-generation power electronics.
“JEP203 and JEP204 are landmark guidelines for SiC power conversion, enabling the industry to confidently adopt SiC in demanding power electronic applications. JEP204, in particular, provides a comprehensive framework of best practices for stressing SiC power devices, offering significant value to both users and suppliers", saidDonald Gajewski, Wolfspeed senior director reliability dngineering, and the chair of the 702_1 Task Group.
"Together, these documents reflect years of industry collaboration and mark a historic milestone in advancing the reliability, safety, and standardisation of SiC technology,”
Thomas Aichinger, senior principal Engineer, SiC technology development, Infineon and the vice-chair of the JC-70.2 subcommittee added: “As the power electronics industry accelerates its transition to SiC, standardisation is the catalyst for confidence and scale. The release of JEP203 and JEP204 delivers exactly that: clear guidelines for short-circuit protection design and a unified stress-test framework for long-term SiC reliability. These new documents give engineers and manufacturers the tools to design safer systems, validate long-term reliability, and align industry practices.”
JC-70
Formed in October 2017 with 22 member companies, JC-70 now has over 70 member companies, underscoring industry commitment to the development of universal standards to help advance the adoption of wide bandgap (WBG) power technologies.
Multinational corporations and technology startups from the US, Europe, Middle East, and Asia are working together to bring to the industry a set of standards for reliability, testing, and parametrics of WBG power semiconductors.
Committee members include industry leaders in power GaN and SiC semiconductors, as well as users of wide bandgap power devices, and test and measurement equipment suppliers. Technical experts from universities and national labs also provide input.
