K-Space introduces new RHEED simulation software
Metrology tool specialist K-Space has announced the kSA RHEED-Simv simulation software.
Simulation possibilities range from basic simulated RHEED (reflection high-energy electron diffraction) patterns of common structures all the way to complex patterns produced by reconstructions or complex surfaces, and even dynamic simulations with changing phenomena.
Users can define the crystal surface and experimental parameters kSA RHEED-Sim, and the software then renders the predicted pattern based on a kinematic, single scattering electron beam diffraction model.
Feature highlights of kSA RHEED-Sim include the ability to visualise the 3D crystal structure for predefined or generated presets; visualise the 2D surface structure relative to the incident electron beam; and define new surfaces to simulate from bulk crystal data loaded from CIF files or generated manually. Users can also overlay the simulation output with other RHEED image data.
kSA RHEED-Sim is available as a standalone application or integrated with kSA 400, an analytical RHEED System.
Pictured above: visualisation of the the 3D unit cell and surface plane.
