News Article
Accel-RF and leading universities to advance GaN technology
The provider of turn-key RF reliability testing systems is making available its resources for groundbreaking research in the area of compound semiconductor RF physics, reliability prediction, and test method improvement.
Accel-RF Corporation is collaborating with leading universities in the area of high frequency GaN technology.
Accel-RF will provide the universities with RF equipment, software, and other services for reliability testing and characterisation of compound semiconductor devices such as GaN. The goal of the collaborations is for the professors and their research teams to use these available resources for groundbreaking research in the area of compound semiconductor RF physics, reliability prediction, and test method improvement.
“Accel-RF is pleased to support our participating universities by providing leading edge reliability test equipment to a team of researchers,” says Roland Shaw, President and Founder of Accel-RF Corporation. “Our equipment, software and support engineering services allow researchers and manufacturers to collect in-situ performance degradation data on RF/microwave devices, and use that data to move forward the understanding of reliability drivers in advanced semiconductor technologies”, adds Shaw.
Announcement of Accel-RF’s university collaboration program bolsters the company’s Cooperative Research and Development Agreement (CRADA) with the Air Force Research Laboratory announced in August of last year.
“The relationship between Accel-RF and our academic partners has and continues to be a win-win situation. The work already completed has born insights to development of more rugged GaN transistor technology that can be deployed in many applications throughout the semiconductor industry” concludes Shaw.
