Info
Info
News Article

Rudolph Reports Record Installations For Semiconductor Software

Increasing demand for productivity information has been driven by needs for better yields in LEDs and compound semiconductor manufacturing
Rudolph Technologies says it has completed record installations in Q4 2013 of its fab-wide yield management software (YMS) products, Discover Enterprise and Genesis Enterprise.

These packages are used by semiconductor manufacturers to obtain process yield and equipment productivity information.

In addition to traditional semiconductor manufacturing, Discover Enterprise Software was installed at a multi-billion dollar OEM in multiple labs, replacing the incumbent technology.

Rudolph attributes the rise in adoption to the industry’s growing need for productivity data as it seeks to increase the yields of new, increasingly complex manufacturing processes.

The data necessary to generate productivity information comes from many different sources throughout the fab: inspection and metrology systems, tool sensors, tool recipes, electrical tests, and the fab environment.

As the complexity and cost of manufacturing processes increase, the value of faster, better analysis to support critical manufacturing decisions grows too, so customers are demanding robust yield management systems that can analyse large, complex data sets quickly and effectively.

Rudolph’s fully-integrated YMS solutions are designed to analyse data from disparate sources and multiple sites to maximise productivity across the entire value chain.

“Improving quality and yield as well as tool productivity were the paramount reasons we selected Rudolph’s YMS solutions," says Philip O’Leary, Six Sigma Master Black Belt, Murata Electronics Oy, a designer and manufacturer of silicon capacitive sensors: accelerometers, gyroscopes, combined sensors and inclinometres.

He adds, “The development of better processes and tool productivity will have direct, positive impact on our yield, and ultimately, create a better product for our customers. The ease of installation was remarkable and the product demonstrated immediate value. In addition, the scalability of the software will facilitate our future expansion plans."

Mike Plisinski, vice president and general manager of Rudolph’s Data Analysis and Review Business Unit, comments, “The integration of our yield management system technologies, Discover Enterprise and Genesis, provides customers with a system designed for storage and alignment of a wide array of data types as well as patented analytics to transform that data into valuable information to help our customers optimise their process, improve equipment productivity, and more rapidly bring new technologies to market."

Discover Enterprise is a real-time manufacturing monitoring and in-line yield management system that provides the foundation of a fully-integrated database and analytical routines that help semiconductor, LED, compound semiconductors, automotive, FPD, HDD and other related manufacturers improve yield, productivity and profitability in their manufacturing lines.

It integrates and analyses data from all inspection, metrology, process, and test systems in the fab and across the supply chain to provide a complete report of fab-wide yield problems, turning raw data into actionable information separating random from systematic yield loss. Process engineers use this information to optimise process tool performance (fleet management) and quickly identify and correct the causes of yield excursions.

Genesis Enterprise is an offline yield management system that provides data mining, genealogy (unit tracking) and correlation of all data types across the supply chain. The system is designed to maximise factory efficiency and automate the drill down process identifying causes of yield loss.

It can be integrated directly with the Discover Enterprise database or be used offline for yield analysis and data mining connecting to raw data files and 3rd party systems. Analysis algorithms identify domain-specific issues, such as wafer processing sequence problems, commonality of effects, product characterisation and systematic versus random yield loss.

Genesis software handles data from any source: parametric, defect, memory, design, or assembly and packaging; and integrates all-surface defect analysis, fault detection, and run-to-run process control to help users achieve maximum efficiency.



AngelTech Live III: Join us on 12 April 2021!

AngelTech Live III will be broadcast on 12 April 2021, 10am BST, rebroadcast on 14 April (10am CTT) and 16 April (10am PST) and will feature online versions of the market-leading physical events: CS International and PIC International PLUS a brand new Silicon Semiconductor International Track!

Thanks to the great diversity of the semiconductor industry, we are always chasing new markets and developing a range of exciting technologies.

2021 is no different. Over the last few months interest in deep-UV LEDs has rocketed, due to its capability to disinfect and sanitise areas and combat Covid-19. We shall consider a roadmap for this device, along with technologies for boosting its output.

We shall also look at microLEDs, a display with many wonderful attributes, identifying processes for handling the mass transfer of tiny emitters that hold the key to commercialisation of this technology.

We shall also discuss electrification of transportation, underpinned by wide bandgap power electronics and supported by blue lasers that are ideal for processing copper.

Additional areas we will cover include the development of GaN ICs, to improve the reach of power electronics; the great strides that have been made with gallium oxide; and a look at new materials, such as cubic GaN and AlScN.

Having attracted 1500 delegates over the last 2 online summits, the 3rd event promises to be even bigger and better – with 3 interactive sessions over 1 day and will once again prove to be a key event across the semiconductor and photonic integrated circuits calendar.

So make sure you sign up today and discover the latest cutting edge developments across the compound semiconductor and integrated photonics value chain.

REGISTER FOR FREE

VIEW SESSIONS

Info
×
Search the news archive

To close this popup you can press escape or click the close icon.
×
Logo
×
Register - Step 1

You may choose to subscribe to the Compound Semiconductor Magazine, the Compound Semiconductor Newsletter, or both. You may also request additional information if required, before submitting your application.


Please subscribe me to:

 

You chose the industry type of "Other"

Please enter the industry that you work in:
Please enter the industry that you work in:
 
X
Info
X
Info
{taasPodcastNotification}
Live Event