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NT-MDT launches AFM with automated, multiple tip exchange

Atomic Force Microscopy (AFM) is expanding rapidly into all venues including semiconductor characterisation
NT-MDT has announced Titanium, what the firm says is the first AFM with a self-aligning, multiple probe cartridge for fast, automated tip exchange.

Titanium’s unique Revolution Cartridge simplifies one of the most challenging steps in AFM workflow: tip exchange and alignment. Revolution holds thirty eight tips.  As each new probe moves into position, Titanium automatically centres and aligns the probe and laser, dramatically cutting downtime for tip exchange as well as opening AFM to less sophisticated users and more routine applications.

Picture: Titanium 38 Probe Revolution Cartridge

NT-MDT’s Titanium feature a 38-probe Revolution Cartridge for multi-probe automated cantilever replacement

Real-time detection of cantilever deflection allows Titanium to collect topographic, mechanical and electrical properties in a single pass, with high quality and spatial resolution. Its robust, stable engineering guarantee exceptionally low drift (0.2nm/min) and low noise level (25fm/ÖHz).

Titanium also offers the new HybriD Mode (HD-AFM Mode), a new high resolution modality especially well-suited to nanomechanical testing.

Other options include a standard AFM head for traditional probes, an AFM head for liquid studies, and an STM head for scanning tunneling and spectroscopy. A nanoindentor measuring head and a heating stage are also available. These solutions provide a robust growth path and make Titanium the ideal instrument for multi-user facilities.  

NT-MDT service stands behind Titanium, offering  a triple warranty that provides free cantilevers (under regular usage) for three years.


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