Nanometrics Introduces Imaging System for advanced LED Manufacturing
Nanometrics, a provider of process control metrology and inspection systems, today announced the launch of its latest photoluminescence (PL) system, Imperia, for advanced compound semiconductor manufacturing.
The Imperia is a fully automated non-contact optical system offering comprehensive metrology and inspection for high brightness LED manufacturing applications. The system enables rapid simultaneous PL measurement and defect inspection. With its advanced software capabilities, the Imperia provides critical defect analysis, classification and yield prediction for critical steps in substrate, epitaxial junction formation, and interconnect processes.
"As HB-LED technology continues to evolve with higher brightness, improved power efficiency power and adoption into more demanding end market requirements, manufacturers are increasingly requiring faster information turnaround to ensure optimal throughput and yield," commented David Doyle, vice president of the materials characterisation group at Nanometrics.
"The Imperia system can quickly determine LED performance long before wafers reach the expensive back end of line processes, enabling HB-LED manufacturers to easily take corrective action for process tuning and contain process excursions early, resulting in lower production costs and shorter cycle times."
Imperia systems were delivered to leading manufacturers in the third and fourth quarter of 2014 and have quickly proven valuable for process control metrology and inspection in advanced devices.
The Imperia system will be introduced at SEMICON Japan 2014 held December 3-5, 2014 at the Tokyo Big Sight, Tokyo, Japan.
