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Accel-RF 'unplugs' SMART Fixture From Accelerated Life-test Platform

Programmable DC bias and RF stimulus control module now available for bench-top testing

Accel-RF Instruments, a San Diego-based developer of test systems for characterising compound semiconductors, has made the RF SMART Fixture from its automated test platform available for bench-top testing.

"Unplugging the SMART Fixture from our accelerated life-test platform for use on a benchtop allows for a quantum reduction in the traditional semiconductor technology development roadmap," said Roland Shaw, president and CEO of Accel-RF. 

"Implementing Accel-RF's Quantum SMART solution provides both accelerated and enhanced return on investment (ROI) by launching products into the market at a much faster pace.  The streamlined productivity of this test solution is crucial for rapid insertion of the new generation of GaN and SiC compound semiconductor technologies envisioned in key commercial and military market sectors" concluded Shaw. 

The Quantum SMART fixture is a programmable self-contained DC bias and RF stimulus control module capable of synchronising independent pulsed-bias and pulsed-RF signals to a device-under-test (DUT) or remote subsystem. The signals are controlled from a user-interface compatible with Accel-RF's LIFETEST software. The fixture is capable of 'active' temperature control and monitoring of a remote DUT through embedded firmware in the microprocessor.

Accel-RF has recently opened a new permanent office in the Innovation Center in Jackson Technology Park, Devens, Massachusetts. The new location will be focused on application support as well as equipment maintenance service for customers in the Eastern United States. Along with personnel, Accel-RF will relocate equipment from its AARTS automated test equipment product line for support and system upgrade capacity.

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