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Aehr gets FOX-NP order for GaN power devices


Customer is a global supplier of semiconductor devices used in EVs and power infrastructure

Aehr Test Systems has received an initial customer order for a FOX-NP wafer level test and burn-in system and a FOX WaferPak Aligner to be used for GaN power devices. The customer is a global supplier of semiconductor devices used in EVs and power infrastructure.

As Aehr’s first GaN customer to order a system, this company selected Aehr due in part to its ability to offer a total solution that allows customers to apply thermal and electrical stress conditions to thousands of devices while still in wafer form.

Gayn Erickson, president and CEO of Aehr Test Systems, commented: “After seeing the positive results from their long and extensive evaluation of our FOX wafer level test systems for their SIC devices, this customer decided to first move forward with our FOX-NP system to test their GaN devices’ long-term reliability failure rates, as well as qualify the production extrinsic failure screening process for their devices in applications where safety, reliability, and/or security are critical.

"A key consideration behind their decision is that the FOX-NP system is 100 percent compatible with the Aehr FOX-XP system that is targeted for high volume production and can support all the test modes needed for both GaN and SIC device testing and burn-in, including high-voltage testing of up to 2,000 volts with full wafer test without electrical arcing that can damage the wafer, which is a distinct advantage of our unique patented technology."

The FOX-NP system, including the FOX WaferPak Aligner, is scheduled to ship and be installed in the current fiscal quarter.

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