Phlux Technology lands SPIE award
Phlux Technology, a UK manufacturer of avalanche photodiode (APD) IR sensors, has landed the prestigious SPIE Prism Award for its Aura family of 1550 nm Noiseless InGaAs APD sensors. The award was made at a gala dinner during Photonics West 2026.
Phlux Technology’s CEO, Ben White, commented: “This is a crowning moment for our team after five years of relentless effort in technical innovation and product commercialization. I’d like to thank all of them, and the distinguished judging panel of industry experts that recognized the importance of this infrared sensing breakthrough – one that will positively impact many industries across the globe in the coming years.”
The sensors are 12 times more sensitive than traditional InGaAs APDs, a performance boost that eluded the IR sensors industry for over 20 years. The improvement was achieved by adding an antimony alloy into the compound semiconductor manufacturing process, which dramatically reduced the noise generated in the avalanche amplification process. It also produced dynamic range improvements, fast recovery in the presence of large signals, and better temperature stability.
Noiseless InGaAs patented technology is the result of eight years of research at the University of Sheffield, UK, and Phlux Technology is a spin-out from the University.
Available in 30 µm, 80 µm and 200 µm versions, for a given laser power the sensors extend the range of IR systems by up to 50 percent. Optionally, significantly lower laser power can be used while maintaining system range. This approach cuts system costs by up to 40 percent and size and weight by up to 30 percent.
Today, the sensors’ primary applications are professional laser range finders, fiber optic test equipment (OTDRs), long-distance LiDAR, and free-space optical communications.
