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Instrument Systems to show Subpixel metrology at Display Week


Company to spotlight applications reflecting the major trend in the display industry: more pixels

At Display Week Exhibition in San Jose, CA, USA from May 14 - 16 Instrument Systems GmbH will put spotlight on applications reflecting the major trend in the display industry: more pixels.

µLEDs are a strong candidate for the realisation of very high display resolutions with pixel sises as small as 10 µm and equally small pixel pitches. A higher resolution means that imaging light measurement devices must compete accordingly.

Within its LumiTop series, Instrument Systems has developed an ultra-high resolution camera for unprecedented accuracy and high speed 2D measurements. In the Innovation-Zone of the Display Week Exhibition the light measuring device will be presented in an application for display testing in production lines where tact times are extremely short. At Instrument Systems GmbH booth, the LumiTop will be shown with a head-mounted display to be measured as innovative AR/VR display application.

The ultra-high resolution LumiTop model merges a 150 megapixel camera with the high-end spectroradiometer CAS 140D. The high accuracy spectral information of the CAS 140D measurements used as live a reference guarantees spectroradiometric test accuracy across the whole image of the camera.

The resolution of 150 megapixels thereby allows (sub-)pixel level analysis of complete displays in one single shot. This measurement device is thus perfect for very fast and accurate quality control and pixel calibration of OLEDs or μLED displays in production lines. According to the company, many different test applications can be organised in a single test station, as, e.g., the evaluation of display uniformity, pixel defects, white balance, colour gamut, contrast ratio or the measurement of intensity modulations. Notably, the LumiTop can be equipped with a fast photometer for flicker or luminance modulation measurements.

The product is integrated in Instrument Systems’ comprehensive new software LumiSuite, which comes with a user-friendly GUI for laboratory applications and a powerful software development kit allowing an easy implementation into any production line.

High-power LED and μLED Testing

Instrument Systems will also show a complete light measurement setup with the high-end array spectroradiometer CAS 140D and the positioning station DTS 140. As the entire spectrum is captured simultaneously, very short measuring times can be achieved in the order of milliseconds with highest measurement accuracy. This suits it to characterising low-lumen or μLEDs. Typical application areas are display production and automotive interior lighting.

VCSEL Testing

The design of the recently launched spectroradiometer CAS 120B-HR is geared to the measurement of narrow-band emission sources e.g., laser diodes (also VCSEL). A high spectral resolution of up to 0.12 nm full width at half maximum and particularly short integration times as low as 4 ms enable fast tests in the lab and production. Time-resolved measurements of laser diodes with a pulsed operating mode in the nanosecond range are also possible in an expanded setup with a photodiode. Demo measurements and evaluations are presented at the booth.

Goniometric Display Measurement

Using the established DMS 803 display measurement system, the company will be giving live demonstrations of the diverse possibilities of viewing angle dependent display analysis: motorised positioning unit, temperature chamber of -40 to +105degC, measurement of the spectral reflection value under direct/diffuse hemisphere lighting, determination of the contrast of OLED and LCD displays with different types of ambient light, etc. The latest features allow a qualification of curved displays.

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