Loading...
News Article

Particle Measuring Systems Releases 20 nm Syringe Sampler

News

SLS 20 provides solutions for batch sampling applications with Chem 20 particle counters

Particle Measuring Systems (PMS) has announced the release of the SLS 20 Syringe Liquid Sampler to be used with the Chem 20 Particle Counter. This new combined solution is designed to provide an unlimited level of monitoring at 20 nm sensitivity.

The SLS 20 enables Chem 20 particle counters to operate in batch sampling applications, in particular precise, small-volume sampling. The system consists of an SLS 20 which is compatible with either corrosive or non-corrosive liquids, all connections necessary to interface with a compatible Chem 20 or Chem 20-HI particle counter and software.

According to the company, this is reliable solution to use anywhere that high sensitivity chemical batch particle monitoring is required including semiconductor, data storage, medical, pharmaceutical, aerospace, or automotive industries for applications such as chemical quality assurance, parts cleanliness testing, water sampling, and more.

“Our new Syringe Sampler gives our customers the option to count 20 nm in batch applications”, said Jerry Gromala, VP of Electronics Division for Particle Measuring Systems. He continued, “Our engineering team is continually working on innovative new solutions to help our customers meet increasing needs for sensitivity”.

×
Search the news archive

To close this popup you can press escape or click the close icon.
Logo
x
Logo
×
Register - Step 1

You may choose to subscribe to the Compound Semiconductor Magazine, the Compound Semiconductor Newsletter, or both. You may also request additional information if required, before submitting your application.


Please subscribe me to:

 

You chose the industry type of "Other"

Please enter the industry that you work in:
Please enter the industry that you work in: