News Article

Thermo Scientific Adds To Failure Analysis Portfolio


New platform provides faster identification of defects that impact device performance

Thermo Fisher Scientific has released the nProber IV nanoprober platform, a fault isolation system used by semiconductor fabs to precisely locate and characterise nanometer-scale electrical faults that impact device performance and reliability.

According to the company, the nProber IV is the highest performance nanoProber in the Thermo Scientific portfolio, specifically targeted at advanced logic and memory. It is designed to complement its other SEM-based solutions that address the nanoprobing needs of failure analysis of compound semiconductors such as GaAs, GaN, SiC.

"As an established leader in failure analysis, we know companies investing in nanoprobing dramatically improve their fault analysis workflows, and the nProber IV platform offers our highest technical performance to date," said Glyn Davies, vice president and general manager of semiconductor at Thermo Fisher. "Semiconductor manufacturers will save time and money by more quickly identifying defects that impact device performance, allowing them to bring better products to market even faster."

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