Tektronix launches Test System for WBG devices
New platform allows fabs to add parametric test capacity for high-growth technologies while minimising investment and maximising wafers per hour
Wide bandgap technologies such as GaN and SiC offer the promise of faster switching speeds, wider temperature ranges, and better power efficiency. To meet testing needs for these products, Tektronix has launched the new Keithley S530 Series Parametric Test System with KTE 7 software.
The system is said to offer lab-grade measurement performance with minimal set-up and test time. High-speed, fully flexible configurations up to 1100V can evolve as new applications emerge and requirements change. This allows chip manufacturers to cost-effectively and efficiently expand into high-growth power and WBG devices (including the automotive market), with minimal test/set-up time, on a single system, and with minimal investment.
"Analogue and mixed-signal semiconductor manufacturers continue to experience strong demand from new end-use applications in 5G communications, automotive, IoT, medical, green energy, and other markets," says Chris Bohn, vice president and general manager at Keithley/Tektronix. "This significant test platform update helps those customers bring new products to market more quickly and cost-effectively, while giving them the agility to adapt to new requirements in the future."
The S530-HV model enables testing up to 1100V on any pin to boost throughput by 50 percent or more over competitive systems in power and WBG applications. Chip manufacturers can test a wide mix of products with a single system, including automotive products per the IATF-16949 quality management standard. Calibration can be performed with minimal downtime in-house or through Tektronix's service organisation.
