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Anadigics awarded four new patents
Anadigics is continuing to innovate in order to improve its product designs and manufacturing techniques
Anadigics has been awarded four new patents related to RFIC production techniques, test technology and electronic design. The first patent was awarded to Anadigics for an electrical contactor for the automatic testing of RF chips, which enhances the company s RF testing capabilities (US patent no. 6437585). A second patent covers an amplifier bias adjustment circuit which offers improved quality for cable TV signals (no. 6404284).
Anadigics received two further patents for innovations in GaAs semiconductor manufacturing technology. Patent 6,415,843 was awarded for a spatula for the separation of a thinned wafer from its mounting, while patent no. 6,458,640 was awarded for a GaAs MESFET having LDD and non-uniform well doping profiles.