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In brief: Cree, Samsung, Bede, ION-TOF

Cree signs a global distribution agreement with Arrow Electronics, Samsung releases an LED-based monitor offering very high quality color reproduction, Bede ships an X-ray tool for SiGe analysis, and ION-TOF launches a high-throughput secondary ion mass spectrometer.
Cree uses Arrow to shoot for customers
LED chip maker Cree has entered into a global distribution agreement with US-based Arrow Electronics.

"With this agreement, Cree is aligning itself with one of the top electronics components distributors in the world to drive the LED lighting revolution," remarked Bob Pollock, Cree's senior vice president of sales.

The products available through Arrow include the XLamp 7090 XR-E, which Cree claims is the first 160-lumen white power LED.

Samsung launches LED-based monitor
The American arm of Samsung Electronics is targeting desktop publishers, video and photography editors and graphic designers with an LED-based high-quality 20-inch monitor.

The monitor, which retails for $1,999, delivers up to 114 percent of the National Television System Committee (NTSC) color gamut. In comparison, traditional LCD screens and cathode ray tubes cover 82 percent and 76 percent of the NTSC color gamut, respectively.

Bede sells X-ray tool for SiGe analysis
UK-based equipment manufacturer Bede X-ray Metrology has shipped a BedeMatrix X-ray tool to a US manufacturing consortium.

The instrument will be used by the chip makers to control the strain and relaxation in SiGe.

"In-line process control of strained silicon is becoming mandatory as the technology nodes are shrinking," said Bede's Frank Hochstenbach, global director of sales and marketing.

"This consortium will benefit from the only production system available for in-line measurement of strained epi-layer composition, thickness and relaxation using high resolution X-ray diffraction and X-ray reflectivity techniques," he added.

ION-TOF speeds element detection
ION-TOF, a German manufacturer of time-of-flight secondary ion mass spectrometers (SIMS), has released the TOF.SIMS 300 R, a fully automated tool that can position whole wafers at high speeds with sub-micron precision.

"Never before has it been possible to operate a time-of-flight SIMS tool with higher throughput, reproducibility and performance," remarked Ewald Niehuis, ION-TOF's Managing Director.

The tool has already been installed at the Fraunhofer Center for Nanoelectronic Technologies, in Dresden, Germany.

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