News Article
Xiris unveils Thin-Film Solar Cell Inspection Tool
The latest offering, the TFI-FLEX is suited to detecting defects in flexible thin film Photovoltaic (PV) cells including cells based on CIGS and CdTe.
Xiris Automation, a 20 year veteran in the machine vision industry, has developed TFI-FLEX, an inspection system used for detecting defects in Flexible Thin Film Photovoltaic Cells.
Designed for in-line quality control use by manufacturers of Flexible Thin Film Cells, TFI-FLEX can detect defects in surface quality and chemical deposition of cells at multiple points along a production line.
The TFI-FLEX Inspection System performs visual checks on the activated side of a flexible thin film cell, looking for defects that are specific to quality issues arising from the handling and manufacture of thin film cells. These can include topological defects such as scratches, bumps and dents. Also, it will detect print/deposition defects such as chemical deposition flaws, stains, spots, watermarks, fingerprints, and color variations.
The system uses a proprietary method of acquiring images with very low optical distortion in color and/or monochrome mode, detecting defects that are much smaller than 1 mm in size.
Xiris claims that TFI-FLEX is an important new tool for inspecting cells after deposition; in particular after laser etching, printing, and final environmental coating of the cells.
The system can easily be retrofitted into existing lines and can be configured to include multiple inspection modules (each with a solution-optimized design).
Xiris will be exhibiting at Intersolar North America 2010 in San Francisco's Moscone Center West Hall from July 13-15, booth # 8151.
