News Article
Solar Metrology Tool Sheds Light on CIGS and CdTe Photovoltaics
SMX Measurement System provides a production-ready suite of thin film thickness and composition measurement.
Solar Metrology, a global provider of X-Fay Fluorescence (XRF) analysis tools, has expanded its portfolio of System SMX thin film composition and thickness measurement tools with the introduction of model SMX-ILH.
The SMX-ILH (In-Line X-ray Head) tool is designed for in-line composition and thickness control of CIGS and CdTe photovoltaic thin film depositions. It offers a full (600 x 1200 mm) lateral range of measurement and can be inserted into printed, electrochemical and thermal film deposition processes.
SMX-ILH provides process control for active, contact and TCO layers in PV thin film stacks, and is capable of analyzing rigid glass, flexible stainless steel and polyimide roll-to-roll substrates. An optional proprietary thermal shield allows for film control at panel temperatures of up to 300 degrees Celsius.
Offering fast and repeatable Copper-to-Gallium ratio determination and both cross-web and cross-panel gradient analysis capability, SMX-ILH tools enable CIGS and CdTe PV panel manufacturers to realize significant yield improvements and conversion efficiency gains in production.
Solar Metrology's SMX Measurement System provides a production-ready suite of thin film thickness and composition measurement tools for research and process development, in-process monitoring and post-process quality control.
Solar Metrology will be exhibiting at Intersolar North America 2010 in San Francisco's Moscone Center West Hall from July 13-15, booth # 9238.
