News Article
Accel-RF To Share Technology with Air Force Research Laboratory
The cooperative research and development agreement relating to compound semiconductor reliability measurements will allow technology transfer between the two organizations.
Accel-RF Corporation has signed a Cooperative Research and Development Agreement (CRADA) with the Aerospace Components and Subsystems Division of the Sensors Directorate of the Air Force Research Laboratory (AFRL/RYD) relating to compound semiconductor reliability measurement expansion.
The agreement enables technology transfer between Accel-RF Corporation and the AFRL for device and component reliability test-method improvement on a broad range of technologies including wide bandgap semiconductors.
“AFRL continues to be a strong advocate for increased quantity and environmentally meaningful test data. This agreement allows a collaborative interaction between our technical staff and AFRL personnel to push forward development of state-of-the-art reliability and performance-degradation testing of semiconductor technologies used in advanced system applications. Reliability testing of state-of-the art technologies is difficult enough, but reliability testing of a significant sample size of discrete devices or MMICs at dc thru V-band and at controlled channel-temperatures for thousands of hours, compounds the problem exponentially,” says Roland Shaw, President and co-founder of Accel-RF.
“We anticipate that sharing our mutual expertise and resources will accelerate the collection of device data and improve the technology diversity of the test samples. The primary goal is to increase confidence levels of long-term reliability on a wide range of semiconductor technology as quickly as possible,” concludes Shaw.
Accel-RF Corporation is a closely-held private corporation located in San Diego, California. The company specializes in the development, design, and production of accelerated life-test/burn-in test systems for RF semiconductor devices.
These systems are turn-key integrated instruments that provide a cost-effective and high-value proposition for manufacturers, fabless designers, testing-service providers, original equipment manufacturers, system integrators, and research and development laboratories requiring intrinsic reliability identification, process-control validation, specification standard-deviation characterization, and product qualification testing.
