News Article
Craic Multi-tool has 20/20 Vision
Non-destructive thin film thickness measurement system will analyze many materials on both transparent and opaque substrates and find defects that others can’t.
CRAIC’s new Technologies has added a 20/20 Film microspectrophotometer to its portfolio and is claimed to rapidly measure the thickness of thin films including sub-micron sampling areas.
With the ability to analyze films of many materials on both transparent and opaque substrates, the 20/20 Film enables the user to determine thin film thickness using transmission or reflectance on semiconductor materials.
“Many of our customers want to measure the thickness of thin films of smaller and smaller sampling areas for rapid quality control of their products. The 20/20 Film microspectrophotometer was built in response to customer requests for a powerful, flexible film thickness tool that can measure sub-micron areas on both transparent and opaque substrates." Said Paul Martin, President of CRAIC Technologies.
"This tool can also do a lot more than just measure thin film thickness. It can also be configured for contamination analysis, concentration and relative intensity mapping and much more," he added.
The product enables thickness measurements of films and substrates and sampling areas can range from over 100 microns to less than 1 micron. Designed for the production environment, it is claimed to incorporate a number of easily modified processing recipes, the ability to create new film recipes and sophisticated tools for analyzing data as well as options for automation including touchscreen control.
The ability to directly image and analyze films with ultraviolet, visible and NIR microscopy can also be added to this instrument.
