+44 (0)24 7671 8970
More publications     •     Advertise with us     •     Contact us
 
News Article

CRAIC Unveils Automated UV-visible-NIR Spectroscopy Tool

The system uses a range of techniques to measure microscopic features and is suited to the thin film measurement of compound semiconductors.

CRAIC’s 20/20 PV microspectrophotometer allows you to image and measure spectra by absorbance, reflectance, fluorescence and emission from the deep ultraviolet to the near infrared.

Now the firm has unveiled an automated version of its flagship product, the 20/20 Perfect Vision UV-visible-NIR microspectrophotometer.

 



This system is designed to be fully programmable with touchscreen controls so that it can automatically analyse microscopic samples with UV-visible-NIR spectroscopy and microscopy.  Imaging and spectroscopic analysis of samples can be done by absorbance, reflectance and fluorescence from the deep UV to far into the near infrared.

The applications are numerous and include thin film measurement of semiconductors and microcolorimetry of flat panel displays. 

 “CRAIC Technologies has been an innovator in the field of UV-visible-NIR microanalysis since its founding. We have helped to advance the field of microscale analysis with innovative instrumentation, software, research and teaching. The automated 20/20 PV microspectrophotometer is the ideal tool for a laboratory or factory due its cost effectiveness for analysing many samples quickly and accurately” states Paul Martin, President of CRAIC Technologies.

“CRAIC Technologies microspectrophotometers are backed by years of experience in both designing, building and the using of this type of instrumentation for imaging and spectroscopic analysis.”

 The automated 20/20 system integrates CRAIC’s Lightblades spectrophotometer technology with custom built UV-visible-NIR microscope and powerful, easy-to-use software.

By including high-resolution digital imaging, the user is also able to use the instrument as an automated UV, colour and NIR microscope.  Sophisticated software, ranging from image analysis, spectral analysis, film thickness determination and colorimetry are all available to enhance its capabilities.

 
×
Search the news archive

To close this popup you can press escape or click the close icon.
×
  • 1st January 1970
  • 1st January 1970
  • 1st January 1970
  • 1st January 1970
  • View all news 22645 more articles
Logo
×
Register - Step 1

You may choose to subscribe to the Compound Semiconductor Magazine, the Compound Semiconductor Newsletter, or both. You may also request additional information if required, before submitting your application.


Please subscribe me to:

 

You chose the industry type of "Other"

Please enter the industry that you work in:
Please enter the industry that you work in: