News Article
X-ray goniometry service orients single-crystal sapphire
The service validates the sample or substrate orientation when polarisation effects are critical and when the user is looking for a cleavage plane or wants to avoid one.
An X-ray diffraction analysis service that employs X-ray goniometry to identify and document differences in the orientation of single-crystal materials has been introduced by Meller Optics, of Providence, Rhode Island.
Meller Optics' X-Ray Goniometry Service measures a specific sample plane of a single-crystal material and provides a flat reference with accuracy on the order of 0.5-3 min. to assure more accurate outcomes of experiments. Suitable for samples from 0.25" sq. and of materials such as sapphire and silicon, the firm can also correct a plane and provide a reference flat, if desired.
Performing sample plane measurements per customer specification, Meller Optics' X-Ray Goniometry Service is typically necessary to validate orientation when the thermal expansion, thermal coefficient and the index of refraction have to be the same in all directions; when birefringence must be maximum or minimum; when polarisation effects are critical; and when the user is looking for a cleavage plane or wants to avoid one.
Meller Optics' X-Ray Goniometry Service is priced from $150.00, depending upon customer requirements. Quotations are provided upon request.
