News Article
Laytec launches tool for high resolution sheet resistance measurements
EddY can be integrated in any solar cell production line as in-line metrology tool for 100% coverage of conductivity properties.
During its participation at the EU PVSEC 2011 in Hamburg, Laytec presented EddY, a novel device for high resolution sheet resistance measurements powered by Suragus.
The new system offers contact-free real-time monitoring of deposition processes of thin-films, e.g. transparent conductive oxides using high speed eddy current measurement. It provides comprehensive conductivity/sheet resistance analysis.
EddY can be integrated in any solar cell production line as in-line metrology tool for 100% coverage of conductivity properties. It enables fast feedback of layer homogeneity and absolute sheet resistance values with direct feedback to the deposition process.
Tight coverage of each glass sheet or other substrates with several measurement points per sheet allows precise process control and SPC. The results enable the user to recognise short-term deviations and long-term trends.
