News Article
NXP to showcase high performance RF at EuMW 2011
The firm will present results on its III-V, silicon germanium and E-GaN products.
At this year’s European Microwave Week (EuMW), technical experts from NXP Semiconductors will be participating in numerous conference sessions.
EuMW 2011 will be held from 9th – 14th October in Manchester, UK, and is an industry-leading event where manufacturers, institutes and industry bodies have the opportunity to discuss relevant issues in Microwave, RF, Wireless, Defence / Security and Radar. NXP will be showcasing the latest High Performance RF technologies and solutions in booth #313.
One highlight this year is the industry panel on “Selecting the Right Technology for High Power Military Applications,” which will be taking place on Wednesday 12th October from 15.00 to 16.30 BST. Mark Murphy, director of RF Power products at NXP Semiconductors, will be speaking.
Conferences
Tuesday 11th October
* EuMIC Conference, Charter 3, High Efficiency Power Amplifier
08:50-09:10 - A Compact 65W 1.7-2.3GHz Class-E GaN Power Amplifier for base stations
* EuMIC Conference, Charter 6, Silicon microwave circuits
09:30 – 09:50 - A Low Power 9.75/10.6GHz PLL in SiGe:C BiCMOS for Ku-Band Satellite LNBs
* EuMIC Conference, Charter 1, Frequency Synthesis and Millimeter-Wave Receivers
13:40 – 15:00 - Frequency Synthesis and Millimeter-Wave Receivers
* EuMIC Conference, Charter 2, Silicon and III-V Based Technologies for Advanced Sub-mm Wave Applications
14:00 – 14:20 - Design of Antenna on-Chip, Antenna-onPackage and Detectors from Microwave and THz Frequency Range in SiGe-C Technology
* EuMIC Conference, Charter 6, Passive circuits based on advanced technologies
15:40 – 16:00 - A Transformer for HighPower RF Applications Using Bondwires in Parallel
* EuMC Poster Sessions 12:30 – 18:00
EuMIC Poster 01-10: Broadband Digitization for Cable Tuners Front-End
EuMIC Poster 02-37: Effects of Inter-Chip and Intra-Chip Electromagnetic Interferences on PLL Frequency Pulling and Spurs
EuMIC Poster 02-38: Design and Verification of Built-in-Self-Test (BIST) for RF, and Microwave Applications
Wednesday 12th October
* EUMC Conference: Communication Subsystems
10:50 – 11:10 - Linearity Considerations for Multi-Standard Cellular
* “Radar Challenges & Solutions” Industry Panel session, Charter 1
15.00 – 16.30 - Selecting the Right Technology for High Power Military Applications
