News Article
Lake Shore releases Hall kit for compound semiconductor characterisation
The new model can be used to assess electrical properties of solar cells as well as many III-V based device such as those based on gallium arsenide, indium phosphide and III-nitrides
Lake Shore Cryotronics, a manufacturer of scientific sensors, instruments, and systems for precise measurement and control, will be featuring its range of cryogenic and cryogenic-free probe stations and 8400 Series Hall Effect Measurement System at SEMICON West 2012, taking place between July 10th and 12th.
The conference is being held at the Moscone Centre in San Francisco, California, and Lake Shore will be exhibiting its latest products in booth #6458. Also on display at the booth will be the Model TTPX cryogenic probe station, as well as information on Lake Shore’s new 8400 Series Hall Effect measurement system.
Model 8404 AC/DC HMS
Lake Shore has ten distinct probe station models, including four cryogen-free probe stations and six cryogenic models. Featured at the booth will be Lake Shore’s lower cost Model TTPX cryogenic micro-manipulated probe station, used for non-destructive testing of devices on full and partial wafers up to 51 mm (2 in) in diameter.
The TTPX measures electrical, electro-optical, parametric, high Z, DC, RF, and microwave properties of materials and test devices. A wide selection of probes, cables, sample holders, and options makes it possible to configure the TTPX to meet specific measurement applications. Other models are available to meet a variety of parameters, including magnet field, maximum number of probe arms, standard temperature range, high and low temperature options, maximum sample size, vacuum, and sample stage rotation. Lake Shore will also be highlighting the new lower-cost cryogen-free probe station, the Model CRX-6.5K.
What's more, Lake Shore will be spotlighting the new 8400 Series Hall effect measurement system (HMS). The AC Hall effect measurement provides better solutions for researchers exploring the electronic and magneto-transport properties of low mobility electronic materials.
Lake Shore’s 8400 Series Hall effect measurement system, which features an optional AC field measurement capability, can measure Hall mobilities down to 10-3 centimetres squared per volt second (cm2/Vs). Applications for the system include measurement of solar cell materials, organic electronics, transparent conducting oxides, III-V and III-VI semiconductors, magnetoresistors, as well as others.
Lake Shore’s product experts will be at the show to answer questions and to discuss features and benefits of Lake Shore’s probe stations and Hall effect measurement systems.
Lake Shore will also feature its new cryogen-free cryogenic probe stations and the Model 8404 Hall effect measurement system at SPIE Optics and Photonics, August 12th to 16th, at the San Diego Convention Centre in San Diego, California, in booth #1122.
Jeffrey R. Lindemuth, a Lake Shore senior scientist, will present a paper, “Variable Temperature Hall Measurements on Low-Mobility, High-Resistivity Materials.” This paper will be part of Session 4: Novel PV Materials and Characterisation Methods, on Sunday August 12th, from 3:30 to 5:10 p.m.
The results presented in this paper were achieved using the Lake Shore Model 8404 Hall effect measurement system and reflect breakthrough characterization capabilities that are important to developers of novel photovoltaic materials. The new Model 8404 has an optional AC field measurement capability that enables measurement of Hall mobilities down to 0.001 cm2/V s, lower than ever possible using traditional DC field Hall measurement techniques. The system comes with optional variable temperature assemblies for temperatures from 15 K to 1273 K.
Lake Shore will also be at the exhibition centre, with product experts on hand to discuss the Model 8404 as well as the advantages of the company’s new cryogen-free probe stations, including the newest low cost CRX-6.5 K probe station.
The 8404 HMS is suited to the characterisation of many materials including CdTe and CIGS solar cells and II-VI and III-V semiconductors such as InP, InSb, InAs, GaAs, GaN, GaP, GaSb, AlN based devices SiC and SiGe materials and HBTs and FETs.
These easy-to-operate cryogenic platforms enable convenient and versatile testing of optical devices, providing superior results and productivity when compared to traditional methods requiring manual immersion of test devices in liquid nitrogen.
