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AMCAD's testing system ideal for GaN & SiC HV transistors

The 1kV/ 30A IV pulse tool provides high voltage signals and short pulse / fast switching capabilities in gallium nitride and silicon carbide devices simultaneously
French firm, AMCAD Engineering has upgraded its PIV semiconductor device analyser family for the next generation of High Voltage Fast Switching (HVFS) Transistors.

HVFS transistors open the way to new targets and new designs for high efficiency DC-DC converters, switches, hubs and servers, telecom base stations, and automotive applications. Other applications include LED drive circuits and Class D audio amplifiers.

The latest HVFS transistor technologies include Enhanced Mode GaN FET and SiC MOSFET. They offer very fast switching frequencies that are up to 10 times higher than previous solutions and permit designers to use lower duty cycles than they currently do.

AMCAD says that until now, there were no efficient testing solutions which highlighted the capabilities of these new technologies. Previous solutions could not provide simultaneously high voltage signals and short pulse / fast switching capabilities.

“AMCAD complements its existing Pulse IV system portfolio by offering a new solution with pulse width down to 400ns@1KV to help customer testing High voltage Fast Switching transistors”, says Tony Gasseling, General Manager. He continues, “Once again, we are very pleased to lead the innovation in the field of semiconductor pulsed characterisation”.

The PIV High Voltage Fast Switching measurement system will be demonstrated for the first time during the European Microwave Week Exhibition, at AMCAD Booth #413. The exhibition will take place in Amsterdam between October 29th and 31st, 2012.

AMCAD Engineering provides solutions to today's electronic design challenges. The company is dedicated to providing the most advanced solutions and tools in test and modelling to the RF, microwave IC and power electronic markets.

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