News Article

Laytec Reveals Non-destructive Metrology Tool For Solar Cell Analysis

The firm says its new tool results in a perfect lamination process, which is the key to high-quality modules
One of the reasons why solar modules fail in the field is the insufficient cross-linking of ethylene vinyl acetate (EVA) caused by vacuum lamination process deviations or unstable EVA foil materials.

Laytec says the current standard tests are slow, destructive, manual, inaccurate and patchy.

X-Link in action

LayTec’s new off-line metrology system X Link provides fast, automated, non-destructive and accurate evaluation of EVA cross-linking degree immediately after lamination. It can be integrated in every solar module production line and offers 100 percent coverage for process and quality control.

The high precision measurements are performed through the backsheet without damaging the laminated surface.

They take only a few seconds, do not influence the performance of the tested module and have a precision of ± 1.5 percent.

With X Link’s direct feedback, the lamination process can be quickly optimised for better cross-linking quality by adjusting the heating zones and the duration of lamination. Laytec claims the result is a perfect lamination process, which is the key to high-quality modules.

The new off-line version of X Link will be presented at the SNEC PV Power Generation Conference & Exhibition in Shanghai in May (Booth E3/802-803) and Intersolar Europe in Munich in June (Booth A5/258).


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