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X-ray Agilent detectors offer smarter sensitivity

A new strategy puts previous detectors in the dark
Agilent Technologies has launched a range of X-ray Diffraction CCD detectors with smart sensitivity control.

The Eos S2, Atlas S2 and Titan S2 CCD detectors offer active areas of 92 mm, 135 mm and 165 mm, respectively, and automatically adapt their sensitivity based on the strength of the diffraction from the sample being studied.



 Agilent GV1000 X-ray Diffractometer with the Atlas S2 CCD Detector.

“Smart Sensitivity Control is very similar to adjusting the ISO setting in digital photography,” says Leigh Rees, Agilent’s XRD general manager. “SSC is part of our Intelligent Measurement System, which also includes the ability to instantly switch hardware-binning modes."

He adds, "This allows the detectors to automatically adjust both sensitivity and dynamic range based on how strong or weak the diffraction is. This unique approach means we’re measuring diffraction data invisible to previous detectors, in faster experiment times and with higher overall data quality.”

Single-crystal X-ray diffraction systems are used for routine analytical chemistry and challenging small-molecule and protein-diffraction studies.

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