+44 (0)24 7671 8970
More publications     •     Advertise with us     •     Contact us
 
News Article

K-Space announces 34 percent boost in Q1 sales

 Customers placing high value on temperature monitoring during thin-film deposition

K-Space Associates, a company specialising in thin-film metrology tools for the semiconductor, compound semiconductor and solar markets, has announced increased sales of 34 percent for Q1 sales of 2015 over 2014 for their patented kSA BandiT wafer and film temperature monitoring system. 

The kSA BandiT technology uses the inherent temperature dependence of a semiconductor's bandgap to directly measure temperature.  Because of its immunity to sources of measurement errors typical with pyrometers, and its ability to measure at temperatures below 200degC, the kSA BandiT is a preferred temperature monitoring tool worldwide for both research facilities and epi-wafer manufacturers.

"Our customers place a high value on the information kSA BandiT can provide in real time during growth, especially in the low temperature regime where other temperature measurement methods fail," commented Barry Wissman, product development engineer at k-Space. 

"We are selling systems configured to measure a wide range of semiconductor band gaps, from GaN at approximately 380nm to CdTe at approximately 830nm, to our best-selling systems that operate in the near infrared for materials like GaAs and InP."

According to the company, the kSA BandiT has recently been highlighted in several journal publications, such as Journal of Electronic Materials, Journal of Crystal Growth, Journal of Vacuum Science and Technology B, and Optics Express. In these articles, scientists worked with materials such as GaAs, InGaAs, InAs, InAlAs, and HgCdTe, allowing real-time measurement of variables such as temperature, film thickness, surface roughness, and growth rate.

In the Journal of Electronic Materials, Jan Wenisch of AIM INFRAROT-MODULE GmbH noted that for growth of HgCdTe on GaAs "it was observed that an increase in growth temperature of only 2degC led to an increase in the cadmium fraction of almost 5 percent for Cd rich compositions", and that "the strong influence of growth temperature [on Cd fraction] shows that it is especially important to have an accurate and reliable temperature measurement system." This result demonstrates the power of the kSA BandiT for reliable, reproducible temperature measurements below 200degC.

×
Search the news archive

To close this popup you can press escape or click the close icon.
×
Logo
×
Register - Step 1

You may choose to subscribe to the Compound Semiconductor Magazine, the Compound Semiconductor Newsletter, or both. You may also request additional information if required, before submitting your application.


Please subscribe me to:

 

You chose the industry type of "Other"

Please enter the industry that you work in:
Please enter the industry that you work in: