Optical metrology tool targets AR/VR, displays and light sources
Instrument Systems presents its new camera system LumiTop X30 AR and a broad range of advanced optical measurement solutions at SPIE AR|VR|MR 2026 and SPIE Photonics West 2026 in San Francisco, USA.
A key highlight, according to the company, will be the launch of the new LumiTop X30 AR – an advanced camera system for precise characterisation of near‑eye displays used in AR glasses.
The new system combines high spatial resolution with the LumiTop X concept, enabling accurate luminance and colour measurements through spectroradiometer‑based colour calibration. The system provides detailed information on virtual image quality – including sharpness, contrast, distortion and uniformity – making it suitable for R&D laboratories developing next‑generation AR optical systems and displays.
Alongside the product launch of LumiTop X30 AR, the company will be showing the LumiTop X150 high‑resolution imaging system with up to 600 MPx for precise MicroLED display analysis, including pixel and sub‑pixel structures; and the LumiTop AR/VR measurement system with fields of view up to 120°, for evaluation of VR headsets with adjustable pupil sizes, focus settings and viewing angles.
The company will also present a talk on 20 January 2026, 2:20–2:40pm called 'Impact of backgrounds on virtual image quality in AR glasses' by Sascha Reinhardt
The talk will explore how varying real-world backgrounds affect the perceived sharpness and colour of virtual images in AR glasses, using precise colourimetric and contrast measurements to quantify these effects.
