CRAIC unveils new Raman microscope
Instrumentation specialist CRAIC Technologies has launched the Apollo M Confocal Raman microscope, for materials research, nanotechnology, and semiconductor analysis.
CRAIC says that by combining confocal Raman spectroscopy with cutting-edge imaging and analytical features, the Apollo M enables researchers to explore and understand complex materials with unmatched precision and detail.
According to the company, the confocal imaging system makes it possible to acquire high-resolution, 3Dl images of materials with exceptional spatial resolution and depth profiling capabilities. In addition, the advanced Raman spectroscopy capabilities give the microscope high sensitivity and signal-to-noise ratio, allowing researchers to detect and analyse even the smallest traces of molecular and structural information.
The Apollo M supports multi-modal imaging techniques, including confocal Raman spectroscopy, fluorescence imaging, and colour microscopy.
An intuitive software interface and automated analysis workflows streamline data acquisition, processing, and interpretation, enabling researchers to maximise productivity and accelerate research outcomes.
